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原子力顯微鏡AFM探針 NanoSensors（二）

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公司名稱天津奧辛博科技有限責任公司
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所在地天津市
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更新時間2025/1/25 12:43:03
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天津奧辛博科技有限責任公司是豪森國際（香港）有限公司在中國大陸的分支機構，注冊于渤海之濱的天津*產(chǎn)業(yè)園區(qū)，為廣大的中國用戶提供全套的實驗室裝備和技術解決方案。公司銷售網(wǎng)絡覆蓋全國并已經(jīng)在上海、廣州和重慶設立分公司，為用戶提供售前咨詢、進口代理、售后應用支持和維修等全方面立體式服務。自2002年成立以來已同多個儀器廠商建立了良好的戰(zhàn)略合作關系，如美國Keysight公司、美國KLA-Tencor公司、法國Formulaction公司、美國BI公司、美國IBSS Group公司、美國BeckmanCoulter公司、美國TA公司、英國Renishaw公司、美國Thermofisher公司、美國PE公司、新加坡BioPSI公司等。近幾年，分子生物物理研究的迅速發(fā)展，前沿的科學技術已經(jīng)為在分子水平上了解一些重要生命現(xiàn)象的本質和機理提供可能，這一影響力已迅速擴展到分子生物學、免疫學、藥物學、合成化學、理論化學、蛋白質工程學等各方面，公司重點轉移至納米材料科學和生物分子學兩大領域的專業(yè)儀器的引進,并簽約代理美國Keysight公司、美國BI公司、新加坡BioPSI公司的產(chǎn)品，成為單分子生物物理領域國內能提供全面檢測手段的代理商。公司強大的技術團隊充分保障了公司的技術能力和服務標準在激烈的市場競爭中始終處于地位。我們堅信用戶滿意和支持是公司發(fā)展的生命線。公司以誠信的經(jīng)營之道贏得客戶的信任，以過硬的技術水平贏得客戶的尊重和認可，在業(yè)內具有深遠的影響力，已成為大型科研儀器進口商的*。

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原子力顯微鏡AFM探針 NanoSensors（二）

原子力顯微鏡AFM探針 NanoSensors（二）產(chǎn)品信息

型號	盒(根)	產(chǎn)品描述
SSS-SEIH	10	Silicon cantilever for non-contact/tapping -mode,special type A, with SUPERSHARPSILICON tip
	20
	50
SSS-SEIHR	10	Silicon cantilever for non-contact/tapping -mode,special type A, with SUPERSHARPSILICON tip detector side : Al-coating
	20
	50
qp-CONT	10	生物探針，懸臂梁: 共振頻率11kHz 力常數(shù) 0.01 N/m; 應用范圍：生物探針、液體探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學研究和生物測試
	20
	50
qp-SCONT	10	生物探針，懸臂梁: 共振頻率11kHz 力常數(shù) 0.01 N/m; 應用范圍：生物探針、液體探針；優(yōu)勢：力常數(shù)和共振頻率波動范圍小，特別適用于的定量納米力學研究和生物測試
	20
	50
PtSi-CONT	10	導電探針，鍍層: 鉑硅；比常規(guī)導電探針更耐磨，電學信號更長久，重復性好、分辨率高。應用范圍：導電探針
	20
	50
ATEC-CONT	10	接觸模式硅探針
	20
	50
ATEC-CONTPt	10	接觸模式硅探針，鍍層：Pt/Ir
	20
	50
ATEC-CONTAu	10	接觸模式探針，臂梁及針尖鍍層：鍍金
ppp-CONT	10	接觸模式探針，
	20
	50
PPP-CONT-W	380
PPP-CONTR	10	接觸模式探針，鍍層：Al
	20
	50
PPP-CONTR-W	380
PPP-XYCONTR	10	接觸模式探針，鍍層：Al ,XY-auto aligment
	20
	50
PPP-CONTPt	10	Silicon cantilever for contact mode, detector side :Pt/Ir-coating ,tip side : Pt/Ir-coating
	20
	50
PPP-CONTPt-W	380
PPP-CONTAu	10	Silicon cantilever for contact mode, detector and tip side : Au-coating
PPP-CONTAuD	10	Silicon cantilever for contact mode, detector side : Au-coating
DT-CONTR	10	金剛石探針，接觸模式，鍍層：Al
	20
	50
CDT-CONTR	10	導電金剛石探針，接觸模式，鍍層：Al
	20
	50
PPP-ZEILR	10	silicon cantilever for contact mode, special type, detector side :Al-coating
	20
	50
PPP-ZEILR-W	380
PPP-RT-CONTR	10	silicon cantilever for contact mode, tip rotated by 180°,detector side :Al-coating
	20
	50
PL2-CONT	10	Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode,
PL2-CONTR	10	Silicon-SPM-Probe with plateau tip, silicon cantilever for contact mode, detector side: Al-coating
TL-CONT	10	Tipless silicon cantilever based on POINTPROBE technology
	20
	50
PPP-CONTSC	10	silicon cantilever for contact mode, short cantilever
	20
	50
PPP-CONTSCR	10	silicon cantilever for contact mode, short cantilever, detector side :Al-coating
	20
	50
PPP-CONTSCR-W	380
PPP-CONTSCPt	10	silicon cantilever for contact mode, short cantilever, detector side :Pt/Ir-coating
	20
	50
PPP-CONTSCAu	10	silicon cantilever for contact mode, short cantilever, detector and tip side :Au-coating
PPP-CONTSCAuD	10	silicon cantilever for contact mode, short cantilever, detector side :Au-coating
PtSi-FM	10	導電探針，鍍層: 鉑硅；比常規(guī)導電探針更耐磨，電學信號更長久，重復性好、分辨率高。應用范圍：導電探針
	20
	50
ATEC-FM	10	軟輕敲探針，鍍層: 無；針尖可視的探針，可應用到對于那些針尖需要被精確定位或必須針尖可見的應用（例如，用于納米操作）來說，ATEC是必然的。由于其超小的半錐角，ATEC系列產(chǎn)品在陡峭的小尺寸圖案樣品測量中表現(xiàn)出很好的性能. Silicon cantilever for force modulation mode,
	20
	50
ATEC-EFM	10	Silicon cantilever for force modulation mode, detector and tip side:Pt/Ir-coating
	20
	50
ATEC-FMAu	10	Silicon cantilever for force modulation mode, detector and tip side:Au-coating
PPP-LFMR	10	Silicon cantilever for lateral/friction force microscopy,detector side: Al-coating
	20
	50
PPP-LFMR-W	380
PPP-FM	10	Silicon cantilever for force modulation mode,
	20
	50
PPP-FM-W	380
PPP-FMR	10	Silicon cantilever for force modulation mode, detector side:Al-coating
	20
	50
PPP-FMR-W	380
PPP-FMAu	10	Silicon cantilever for force modulation mode, detector and tip side: Au-coating
PPP-FMAuD	10	Silicon cantilever for force modulation mode, detector side: Au-coating
PPP-QFMR	10	Silicon cantilever for force modulation mode, High quality factor for UHV applications, detector side: Al-coating
PPP-RT-FMR	10	Silicon cantilever for force modulation mode, Tip rotated by 180°,detector side: Al-coating
	20
	50
PL2-FM	10	Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode,
PL2-FMR	10	Silicon-SPM-Probe with plateau tip, Silicon cantilever for force modulation mode, detector side:Al-coating
TL-FM	10	Tipless silicon cantilever based on POINTPROBE technology
	20
	50
SSS-FM	10	Silicon cantilever for force modulation mode, With SUPERSHARPSILICON tip
	20
	50
SSS-FMR	10	Silicon cantilever for force modulation mode, With SUPERSHARPSILICON tip, detector side:Al-coating
	20
	50
DT-FMR	10	金剛石探針，Silicon cantilever for force modulation mode, 鍍層：Al
	20
	50
CDT-FMR	10	導電金剛石探針，Silicon cantilever for force modulation mode, 鍍層：Al
	20
	50
PPP-EFM	10	Silicon cantilever for electrostatic force Microscopy, detector side:Pt/Ir-coating , tip side: Pt/Ir-coating
	20
	50
PPP-EFM-W	370
PPP-MFMR	10	Silicon cantilever for Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating
	20
	50
PPP-MFMR-W	370
PPP-LM-MFMR	10	Silicon cantilever for Magnetic force Microscopy, Low Moment ,detector side:Al-coating , tip side: hard magnetic coating
	20
	50
PPP-LC-MFMR	10	Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,detector side:Al-coating , tip side: hard magnetic coating
	20
	50
PPP-QLC-MFMR	10	Silicon cantilever for Magnetic force Microscopy, Low Coercivity ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating
SSS-MFMR	10	Silicon cantilever for high resolution Magnetic force Microscopy, detector side:Al-coating , tip side: hard magnetic coating
	20
	50
SSS-QMFMR	10	Silicon cantilever for Magnetic force Microscopy, ,high quality factor for UHV applications,detector side:Al-coating , tip side: hard magnetic coating
2D200	1	CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,200nm pitch
2D300	1	CALIBRATION STANDARD for x-y calibration of the scanning mechanism,lattice of inverted pyramids,300nm pitch
H8	1	HEIGHT STANDARD for very precise z-calibration,nominal step height: 8nm
FLAT	1	FLATNESS STANDARD for analysis and correction of the scanner bow,smooth plane with a maximum peak to valley distance of 10nm on a 100x100u㎡ area